Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection

A. Berrier, M.C. Schaafsma, J. Gómez Rivas, H. Schäfer-Eberwein, P. Haring Bolivar, L. Tripodi, M.K. Matters-Kammerer

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
6 Downloads (Pure)

Abstract

We demonstrate the operation of a miniaturized all-electronic CMOS based THz spectrometer with performances comparable to that of a THz-TDS spectrometer in the frequency range 20 to 220 GHz. The use of this all-electronic THz spectrometer for detection of a thin TiO2 layer and a B. subtilis bacteria film on top of a plasmonic surface is evaluated. The detection of deeply subwavelength layers with comparable performance as a femtosecond laser based THz-TDS spectrometer is demonstrated. The size of the all-electronic spectrometer is 5 cm by 1cm. The high degree of integration of this spectrometer in combination with plasmonics enhanced sensitivity opens the way to bring THz spectroscopy to consumer applications or to the practitioner's office.

Original languageEnglish
Title of host publicationEuropean Microwave Week 2015: "Freedom Through Microwaves", EuMW 2015 - Conference Proceedings; 2015 45th European Microwave Conference Proceedings, EuMC
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages925-928
Number of pages4
ISBN (Print)978-2-87487-039-2
DOIs
Publication statusPublished - 2 Dec 2015
Event45th European Microwave Conference (EuMC 2015) - Paris, France
Duration: 7 Sep 201510 Sep 2015
Conference number: 45

Conference

Conference45th European Microwave Conference (EuMC 2015)
Abbreviated titleEuMC 2015
CountryFrance
CityParis
Period7/09/1510/09/15
OtherConference held as part of the 18th European Microwave Week (EuMW 2015)

Keywords

  • CMOS non-linear transmission line
  • plasmonics
  • sensing
  • Terahertz spectroscopy

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