Electron temperature measurement in an ultracold atoms-based electron source

G. Taban, B. Fleskens, M.P. Reijnders, O.J. Luiten, E.J.D. Vredenbregt

Research output: Contribution to conferenceOther

1 Downloads (Pure)

Abstract

No abstract
Original languageEnglish
Number of pages1
Publication statusPublished - 2008
Event20th NNV/CPS Symposium on Plasma Physics and Radiation Technology - Lunteren, Netherlands
Duration: 4 Mar 20085 Mar 2008

Conference

Conference20th NNV/CPS Symposium on Plasma Physics and Radiation Technology
CountryNetherlands
CityLunteren
Period4/03/085/03/08

Fingerprint Dive into the research topics of 'Electron temperature measurement in an ultracold atoms-based electron source'. Together they form a unique fingerprint.

Cite this