Electron probe microanalysis of thin (>1 nm) films

G.F. Bastin, J.M. Dijkstra, H.J.M. Heijligers

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationProceedings 50th Annual meeting
Place of PublicationEspoo & Helsinki, Finland
PublisherScandinavian Society
Pages3-4
Publication statusPublished - 1998

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