Electromagnetic simulations for nanoscale RF blocks

W.H.A. Schilders, L.M. Silveira, J. Fernández Villena

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Next-generation nano-scale RFIC designs have an unprecedented complexity and performance that will inevitably lead to costly re-spins and loss of market opportunities. In order to cope with this, efficient and accurate models of interconnects, integrated inductors, the substrate and devices, together with their mutual interactions, need to be developed. The key idea is that integrated devices can no longer be treated in isolation as the EM interactions due to proximity effects are becoming more relevant in the behavior of the complete system. EM simulations must also address these interactions, so new procedures and models able to be included in coupled simulation must be developed. But these simulations may become very expensive as the complexity of the system increases, so model order reduction techniques able to treat these coupling effects are necessary in order to obtain a better performance. In this work some solutions for efficient simulation of such problems are introduced.
Original languageEnglish
Title of host publicationProceedings of the 8th IEEE Africon Conference (Africon 2007) 26-28 October 2007, Windhoek, South Africa
Place of PublicationPiscataway NJ
PublisherInstitute of Electrical and Electronics Engineers
Pages628-634
ISBN (Print)978-1-4244-0987-7
DOIs
Publication statusPublished - 2007
EventAfricon 2007 - Windhoek, South Africa
Duration: 26 Jun 200728 Jun 2007

Conference

ConferenceAfricon 2007
CountrySouth Africa
CityWindhoek
Period26/06/0728/06/07

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