Electrical on-wafer testing of photonic integrated circuits (PICs)

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Abstract

Characterization of Photonic ICs is time consuming because the optical ports can only be accessed after dicing of the wafer, and optical alignment tolerances for accurate measurement are very tight. A major improvement in measurement speed and accuracy can be achieved by testing the major properties on-wafer using only electrical contacts. Electrical testing of optical properties needs integration of calibrated light sources and detectors. Here we describe an approach for electrical testing of the properties of the most important components in photonic ICs.
Original languageEnglish
Title of host publicationProceedings of the 16th Annual symposium of the IEEE Photonics Benelux Chapter, 01-02 December 2011, Ghent, Belgium
EditorsP. Bienstman, G. Morthier, G. Roelkens, xx et al.
Place of PublicationGhent, Belgium
PublisherUniversiteit Gent
Pages145-148
ISBN (Print)978-90-85784-67-8
Publication statusPublished - 2011
Event16th Annual Symposium of the IEEE Photonics Benelux Chapter, December 1-2, 2011, Ghent, Belgium - Ghent, Belgium
Duration: 1 Dec 20112 Dec 2011
http://www.photonics-benelux.org/symp11/

Conference

Conference16th Annual Symposium of the IEEE Photonics Benelux Chapter, December 1-2, 2011, Ghent, Belgium
CountryBelgium
CityGhent
Period1/12/112/12/11
Internet address

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