Electrical method for on-wafer modal gain characterization of semiconductor optical amplifiers

E. Bitincka; R.G. Broeke; M.K. Smit

Electrical method for on-wafer modal gain characterization of semiconductor optical amplifiers

E. Bitincka
, R.G. Broeke
, M.K. Smit

Photonic Integration

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Downloads (Pure)

Original language	English
Title of host publication	Proceedings of the 17th European Conference on Integrated Optics and Technical Exhibitionan, 19th Microoptics Conference(ECIO-MOC), 24-27 June 2014, Nice, France
Pages	We 3a R3-1/2
Publication status	Published - 2014

Cite this

@inproceedings{94364a24927c4168b6bcb46c1f9c21c8,

title = "Electrical method for on-wafer modal gain characterization of semiconductor optical amplifiers",

author = "E. Bitincka and R.G. Broeke and M.K. Smit",

year = "2014",

language = "English",

pages = "We 3a R3--1/2",

booktitle = "Proceedings of the 17th European Conference on Integrated Optics and Technical Exhibitionan, 19th Microoptics Conference(ECIO-MOC), 24-27 June 2014, Nice, France",

}

Electrical method for on-wafer modal gain characterization of semiconductor optical amplifiers. / Bitincka, E.; Broeke, R.G.; Smit, M.K.
Proceedings of the 17th European Conference on Integrated Optics and Technical Exhibitionan, 19th Microoptics Conference(ECIO-MOC), 24-27 June 2014, Nice, France. 2014. p. We 3a R3-1/2.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Electrical method for on-wafer modal gain characterization of semiconductor optical amplifiers

AU - Bitincka, E.

AU - Broeke, R.G.

AU - Smit, M.K.

PY - 2014

Y1 - 2014

M3 - Conference contribution

SP - We 3a R3-1/2

BT - Proceedings of the 17th European Conference on Integrated Optics and Technical Exhibitionan, 19th Microoptics Conference(ECIO-MOC), 24-27 June 2014, Nice, France

ER -