Electrical behaviour of defects at a thermally oxidized silicon surface

M.V. Whelan

Research output: Thesis › Phd Thesis 1 (Research TU/e / Graduation TU/e)

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Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	Philips
Supervisors/Advisors	Tummers, L.J., Promotor Memelink, O.W., Promotor, External person
Award date	27 Oct 1970
Place of Publication	Eindhoven
Publisher	Technische Hogeschool Eindhoven
DOIs	https://doi.org/10.6100/IR43026
Publication status	Published - 1970

Access to Document

@phdthesis{a2b60f9bc098426cb6090ce10a2a4b5d,

title = "Electrical behaviour of defects at a thermally oxidized silicon surface",

author = "M.V. Whelan",

year = "1970",

doi = "10.6100/IR43026",

language = "English",

publisher = "Technische Hogeschool Eindhoven",

type = "Phd Thesis 1 (Research TU/e / Graduation TU/e)",

school = "Philips",

}