Electrical behaviour of defects at a thermally oxidized silicon surface

M.V. Whelan

    Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

    311 Downloads (Pure)
    Original languageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • Frits Philips Inst. Quality Management
    Supervisors/Advisors
    • Tummers, L.J., Promotor
    • Memelink, O.W., Promotor, External person
    Award date27 Oct 1970
    Place of PublicationEindhoven
    Publisher
    DOIs
    Publication statusPublished - 1970

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