Electric field measurements by fluorescence-dip Stark spectroscopy

E. Wagenaars, G.M.W. Kroesen, M.D. Bowden

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Abstract

No abstract
Original languageEnglish
Title of host publicationProgram of the 58th Gaseous Electronics Conference, 16-20 October 2005, San Jose, California
PublisherAmerican Physical Society
Publication statusPublished - 2005
Event58th Annual Gaseous electronics Conference (GEC 2005), October 16-20, 2005, San Jose, California - San Jose, United States
Duration: 16 Oct 200520 Oct 2005

Publication series

NameBulletin of the American Physical Society
Volume50
ISSN (Print)0003-0503

Conference

Conference58th Annual Gaseous electronics Conference (GEC 2005), October 16-20, 2005, San Jose, California
Abbreviated titleGEC 2005
CountryUnited States
CitySan Jose
Period16/10/0520/10/05

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