Electric field induced surface passivation of Si by atomic layer deposited Al2O3 studied by optical second-harmonic generation

W.M.M. Kessels, J.J.H. Gielis, B. Hoex, N.M. Terlinden, G. Dingemans, V. Verlaan, M.C.M. Sanden, van de

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

Recently, we have demonstrated that ultrathin («30 nm) films of Al2O3 synthesized by (plasma-assisted) atomic layer deposition (ALD) provide an excellent level of surface passivation of c-Si which may find important applications in (high-efficiency) solar cells. In this contribution, the Al2O3 passivation mechanism has been further elucidated by the contactless characterization of the c-Si/Al2O3 interface by optical second-harmonic generation (SHG). SHG has revealed effective field-effect passivation of the c-Si surface caused by a negative fixed charge density of 5×1012 cm-2 in an annealed, 11 nm thick Al2O3 film while it is on the order of 1011 cm™2 in the as-deposited film which shows negligible passivation. A comparison with SHG measurements on a 84 nm thick a-SiNx:H film treated in a conventional firing furnace has revealed the presence of a positive fixed charge density of 2×1012 cm-2 which further corroborates the SHG analysis and results.
Original languageEnglish
Title of host publicationProceedings of the 34th IEEE Photovoltaic Specialist Conference (PVSC 2009) 7-12 June 2009 Philadelphia, USA
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages000427-000431-
ISBN (Print)978-1-4244-2949-3
DOIs
Publication statusPublished - 2009

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