Efficient estimation of die-level process parameter variations via the EM-algorithm

A. Zjajo, S. Krishnan, J. Pineda de Gyvez

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
283 Downloads (Pure)

Abstract

A new approach for efficient estimation of die-level process parameter variations based on the expectation- maximization algorithm is proposed. To estimate the parameters and enhance diagnostic analysis, dedicated embedded sensors have been designed. Additionally, to guide the test with the information obtained through monitoring process variations, maximum-likelihood method and adjusted support vector machine classifier is employed. The information acquired is re-used and supplement the circuit calibration. The proposed estimation method is evaluated on a prototype ADC converter with dedicated sensors fabricated in standard single poly, five metal 0.09-mum CMOS.
Original languageEnglish
Title of host publicationDesign and Diagnostics of Electronic Circuits and Systems 2008, DDECS 2008, 11th IEEE Workshop 16-18-04-2008
Pages1-16
DOIs
Publication statusPublished - 2008

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