Efficient estimation of die-level process parameter variations via the EM-algorithm

A. Zjajo; S. Krishnan; J. Pineda de Gyvez

doi:10.1109/DDECS.2008.4538804

Efficient estimation of die-level process parameter variations via the EM-algorithm

A. Zjajo, S. Krishnan, J. Pineda de Gyvez

Electronic Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

349 Downloads (Pure)

Abstract

A new approach for efficient estimation of die-level process parameter variations based on the expectation- maximization algorithm is proposed. To estimate the parameters and enhance diagnostic analysis, dedicated embedded sensors have been designed. Additionally, to guide the test with the information obtained through monitoring process variations, maximum-likelihood method and adjusted support vector machine classifier is employed. The information acquired is re-used and supplement the circuit calibration. The proposed estimation method is evaluated on a prototype ADC converter with dedicated sensors fabricated in standard single poly, five metal 0.09-mum CMOS.

Original language	English
Title of host publication	Design and Diagnostics of Electronic Circuits and Systems 2008, DDECS 2008, 11th IEEE Workshop 16-18-04-2008
Pages	1-16
DOIs	https://doi.org/10.1109/DDECS.2008.4538804
Publication status	Published - 2008

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title = "Efficient estimation of die-level process parameter variations via the EM-algorithm",

abstract = "A new approach for efficient estimation of die-level process parameter variations based on the expectation- maximization algorithm is proposed. To estimate the parameters and enhance diagnostic analysis, dedicated embedded sensors have been designed. Additionally, to guide the test with the information obtained through monitoring process variations, maximum-likelihood method and adjusted support vector machine classifier is employed. The information acquired is re-used and supplement the circuit calibration. The proposed estimation method is evaluated on a prototype ADC converter with dedicated sensors fabricated in standard single poly, five metal 0.09-mum CMOS.",

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Efficient estimation of die-level process parameter variations via the EM-algorithm. / Zjajo, A.; Krishnan, S.; Pineda de Gyvez, J.

Design and Diagnostics of Electronic Circuits and Systems 2008, DDECS 2008, 11th IEEE Workshop 16-18-04-2008. 2008. p. 1-16.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Krishnan, S.

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AB - A new approach for efficient estimation of die-level process parameter variations based on the expectation- maximization algorithm is proposed. To estimate the parameters and enhance diagnostic analysis, dedicated embedded sensors have been designed. Additionally, to guide the test with the information obtained through monitoring process variations, maximum-likelihood method and adjusted support vector machine classifier is employed. The information acquired is re-used and supplement the circuit calibration. The proposed estimation method is evaluated on a prototype ADC converter with dedicated sensors fabricated in standard single poly, five metal 0.09-mum CMOS.

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DO - 10.1109/DDECS.2008.4538804

M3 - Conference contribution

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EP - 16

BT - Design and Diagnostics of Electronic Circuits and Systems 2008, DDECS 2008, 11th IEEE Workshop 16-18-04-2008

ER -

Efficient estimation of die-level process parameter variations via the EM-algorithm

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