Efficient damage sensitivity analysis in advanced Cu/Low-k bond pad structures using area release energy

O. Sluis, van der, R.A.B. Engelen, W.D. Driel, van, M.A.J. Gils, van, R.B.R. Silfhout, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

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