Effects of virtual development on product quality: exploring defect causes

J.C. Jacobs; J.H. Moll, van; P. Krause; R.J. Kusters; J.J.M. Trienekens

doi:10.1109/STEP.2003.8

Effects of virtual development on product quality: exploring defect causes

J.C. Jacobs, J.H. Moll, van, P. Krause, R.J. Kusters, J.J.M. Trienekens

Information Systems IE&IS

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	Proceedings Eleventh International Workshop on Software Technology and Engineering Practice
Editors	L. O'Brien, N. Gold, K. Kontogiannis
Place of Publication	Piscataway
Publisher	IEEE Computer Society
Pages	6-16
ISBN (Print)	0769522181
DOIs	https://doi.org/10.1109/STEP.2003.8
Publication status	Published - 2004

Access to Document

10.1109/STEP.2003.8

Cite this

Jacobs, J. C., Moll, van, J. H., Krause, P., Kusters, R. J., & Trienekens, J. J. M. (2004). Effects of virtual development on product quality: exploring defect causes. In L. O'Brien, N. Gold, & K. Kontogiannis (Eds.), Proceedings Eleventh International Workshop on Software Technology and Engineering Practice (pp. 6-16). IEEE Computer Society. https://doi.org/10.1109/STEP.2003.8

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Effects of virtual development on product quality: exploring defect causes. / Jacobs, J.C.; Moll, van, J.H.; Krause, P. et al.

Proceedings Eleventh International Workshop on Software Technology and Engineering Practice. ed. / L. O'Brien; N. Gold; K. Kontogiannis. Piscataway : IEEE Computer Society, 2004. p. 6-16.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

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AU - Jacobs, J.C.

AU - Moll, van, J.H.

AU - Krause, P.

AU - Kusters, R.J.

AU - Trienekens, J.J.M.

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M3 - Conference contribution

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BT - Proceedings Eleventh International Workshop on Software Technology and Engineering Practice

A2 - O'Brien, L.

A2 - Gold, N.

A2 - Kontogiannis, K.

PB - IEEE Computer Society

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