Effects of RF life-test on LF electrical parameters of GaAs power MESFETs

N. Saysset-Malbert, B. Lambert, N.C. Maneux, N. Labat, A. Touboul, Y. Danto, L.K.J. Vandamme, P. Huguet, P. Auxemery, F. Garat

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

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Physics & Astronomy