Abstract
We compare the structural properties of InN and In0.95Ga0.05N films grown on O-face ZnO(000 (1) over bar) substrates at different temperatures. The small amount of Ga results in dramatic changes in the morphology and structural properties of InN. In particular, inversion domains start to appear at higher temperatures in the In0.95Ga0.05N film. This process is a consequence of the chemical reaction of ZnO with Ga which can be prevented by choosing the substrate temperature to be 450 degrees C or below. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4739941]
Original language | English |
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Article number | 052103 |
Pages (from-to) | 1-5 |
Journal | Applied Physics Letters |
Volume | 101 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2012 |