Effects of defects in UML models

C.F.J. Lange, M.R.V. Chaudron

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationProceedings of the 3rd BENEVOL Workshop (Eindhoven, The Netherlands, May 26-27, 2005)
EditorsC.F.J. Lange, M.R.V. Chaudron, T. Tourwé
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Publication statusPublished - 2006

Publication series

NameComputer Science Reports
ISSN (Print)0926-4515

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