Effects of defects in UML models

C.F.J. Lange; M.R.V. Chaudron

Effects of defects in UML models

Mathematics and Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Original language	English
Title of host publication	Proceedings of the 3rd BENEVOL Workshop (Eindhoven, The Netherlands, May 26-27, 2005)
Editors	C.F.J. Lange, M.R.V. Chaudron, T. Tourwé
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Pages	23-36
Publication status	Published - 2006

Publication series

Name	Computer Science Reports
Volume	06-01
ISSN (Print)	0926-4515

Cite this

@inproceedings{bb9b03ac919044aa9a0e2c8f445544f8,

title = "Effects of defects in UML models",

author = "C.F.J. Lange and M.R.V. Chaudron",

year = "2006",

language = "English",

series = "Computer Science Reports",

publisher = "Technische Universiteit Eindhoven",

pages = "23--36",

editor = "C.F.J. Lange and M.R.V. Chaudron and T. Tourw{\'e}",

booktitle = "Proceedings of the 3rd BENEVOL Workshop (Eindhoven, The Netherlands, May 26-27, 2005)",

}

Effects of defects in UML models. / Lange, C.F.J.; Chaudron, M.R.V.

Proceedings of the 3rd BENEVOL Workshop (Eindhoven, The Netherlands, May 26-27, 2005). ed. / C.F.J. Lange; M.R.V. Chaudron; T. Tourwé. Eindhoven : Technische Universiteit Eindhoven, 2006. p. 23-36 (Computer Science Reports; Vol. 06-01).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - Effects of defects in UML models

AU - Lange, C.F.J.

AU - Chaudron, M.R.V.

PY - 2006

Y1 - 2006

M3 - Conference contribution

T3 - Computer Science Reports

SP - 23

EP - 36

BT - Proceedings of the 3rd BENEVOL Workshop (Eindhoven, The Netherlands, May 26-27, 2005)

A2 - Lange, C.F.J.

A2 - Chaudron, M.R.V.

A2 - Tourwé, T.

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -