Effect of stray field on local spin modes in exchange-biased magnetic tunnel junction elements

J.H.H. Rietjens, C. Józsa, W.J.M. Jonge, de, B. Koopmans, H. Boeve

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
141 Downloads (Pure)

Abstract

We report on the detection of localized spin modes in a multilayered spintronic device by means of time-resolved scanning Kerr microscopy. Measurements on this 13×9 µ m2 exchange-biased magnetic tunnel junction element at different applied bias fields indicate a strong effect of the stray field from the pinned CoFe layer on the magnetization dynamics in the free NiFe layer. This view is supported by micromagnetic simulations, which also show that the dynamics can be attributed to the specific shape of the internal magnetic field in the element. © 2005 American Institute of Physics.
Original languageEnglish
Article number172508
Pages (from-to)172508-1/3
Number of pages3
JournalApplied Physics Letters
Volume87
Issue number17
DOIs
Publication statusPublished - 2005

Fingerprint

Dive into the research topics of 'Effect of stray field on local spin modes in exchange-biased magnetic tunnel junction elements'. Together they form a unique fingerprint.

Cite this