Effcient orthonormality testing for synthesis with pass-transistor selectors

M.R.C.M. Berkelaar, L.P.P.P. Ginneken, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. 1995 ACM/IEEE International Conference on Computer-Aided Design
Pages256-263
Publication statusPublished - 1995
Event1995 ACM/IEEE International Conference on Computer-Aided Design (ICCAD) - San Jose, United States
Duration: 5 Nov 19959 Nov 1995

Conference

Conference1995 ACM/IEEE International Conference on Computer-Aided Design (ICCAD)
CountryUnited States
CitySan Jose
Period5/11/959/11/95
Other1995 ACM/IEEE International Conference on Computer-Aided Design, San Jose, CA, 5 November 1995

Cite this

Berkelaar, M. R. C. M., & Ginneken, van, L. P. P. P. (1995). Effcient orthonormality testing for synthesis with pass-transistor selectors. In Proc. 1995 ACM/IEEE International Conference on Computer-Aided Design (pp. 256-263)