Effcient orthonormality testing for synthesis with pass-transistor selectors

M.R.C.M. Berkelaar, L.P.P.P. Ginneken, van

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. 1995 ACM/IEEE International Conference on Computer-Aided Design
Pages	256-263
Publication status	Published - 1995
Event	1995 ACM/IEEE International Conference on Computer-Aided Design (ICCAD) - San Jose, United States Duration: 5 Nov 1995 → 9 Nov 1995

Conference	1995 ACM/IEEE International Conference on Computer-Aided Design (ICCAD)
Country/Territory	United States
City	San Jose
Period	5/11/95 → 9/11/95
Other	1995 ACM/IEEE International Conference on Computer-Aided Design, San Jose, CA, 5 November 1995

Cite this

@inproceedings{29959521525a49e5854a36acb303784a,

title = "Effcient orthonormality testing for synthesis with pass-transistor selectors",

author = "M.R.C.M. Berkelaar and {Ginneken, van}, L.P.P.P.",

year = "1995",

language = "English",

pages = "256--263",

booktitle = "Proc. 1995 ACM/IEEE International Conference on Computer-Aided Design",

note = "1995 ACM/IEEE International Conference on Computer-Aided Design (ICCAD) ; Conference date: 05-11-1995 Through 09-11-1995",

}

TY - GEN

T1 - Effcient orthonormality testing for synthesis with pass-transistor selectors

AU - Berkelaar, M.R.C.M.

AU - Ginneken, van, L.P.P.P.

PY - 1995

Y1 - 1995

M3 - Conference contribution

SP - 256

EP - 263

BT - Proc. 1995 ACM/IEEE International Conference on Computer-Aided Design

T2 - 1995 ACM/IEEE International Conference on Computer-Aided Design (ICCAD)

Y2 - 5 November 1995 through 9 November 1995

ER -