Abstract
For decades, EDA test generation tools for digital logic have relied on the Stuck-At fault model, despite the fact that process technologies moved forward from TTL (for which the Stuck-At fault model was originally developed) to nanometer-scale CMOS. Under pressure from their customers, especially in quality-sensitive application domains such as automotive, in recent years EDA tools have made great progress in improving their detection capabilities for new defects in advanced process technologies. For this Hot-Topic Session, we invited the three major EDA vendors to present their recent greatest innovations in hiqh-quality automatic test pattern generation, as well as their lead customers to testify of actual production results.
Original language | English |
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Title of host publication | 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 123-128 |
ISBN (Print) | 978-1-4577-2145-8 |
DOIs | |
Publication status | Published - 2012 |
Externally published | Yes |
Event | 15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012 - ICC, Dresden, Germany Duration: 12 Mar 2012 → 16 Mar 2012 Conference number: 15 https://www.date-conference.com/date12/ |
Conference
Conference | 15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012 |
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Abbreviated title | DATE 2012 |
Country/Territory | Germany |
City | Dresden |
Period | 12/03/12 → 16/03/12 |
Other | |
Internet address |