Dynamic response-based LEDs health and temperature monitoring

Anton Alexeev (Corresponding author), Jean Paul Linnartz, Grigory Onushkin, Kumar Arulandu, Genevieve Martin

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Abstract

This paper presents a number of novel methods to measure the junction temperature and to estimate the health of gallium nitride light-emitting diodes (LEDs). The methods are based on measurements of the dynamic impedance and optical output. Our experimental analysis reveals temperature sensitive parameters of the electrical and optical responses. Moreover, a correlation between the non-radiative current characterizing the active region defects and the small-signal impedance is shown. The demonstrated methods can be applied to enhance existing temperature-monitoring techniques. The derived dependencies also build a foundation for advanced in-field health monitoring of the LEDs using the infrastructure of visible light communication systems. Such methods and techniques are valuable for predictive maintenance of solid state lighting systems.

Original languageEnglish
Article number107599
Number of pages8
JournalMeasurement: Journal of the International Measurement Confederation
Volume156
DOIs
Publication statusPublished - May 2020

Keywords

  • Defects
  • Electrical response
  • Failure modes
  • Impedance
  • LED
  • Optical response
  • OWC
  • Reliability
  • Smart driver
  • Temperature

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