Dynamic probe calibration up to 10 kHz using laser interferometry

H. Haitjema; G.J.W.L. Kotte

doi:10.1016/S0263-2241(97)00052-3

Dynamic probe calibration up to 10 kHz using laser interferometry

H. Haitjema, G.J.W.L. Kotte

Mechanical Engineering

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

This paper describes two systems for dynamic probe calibrations which are in use at the Van Swinden Laboratory of the Netherlands Measurements Institute (NMi-VSL). The systems have in common that they enable both static and dynamic probe calibration using a laser interferometer. The displacements are generated using piezoelectric devices. Measurements are shown which illustrate the capabilities of the systems to characterize and calibrate fast-moving probes.

Original language	English
Pages (from-to)	107-111
Journal	Measurement: Journal of the International Measurement Confederation
Volume	21
Issue number	3
DOIs	https://doi.org/10.1016/S0263-2241(97)00052-3
Publication status	Published - 1997

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title = "Dynamic probe calibration up to 10 kHz using laser interferometry",

abstract = "This paper describes two systems for dynamic probe calibrations which are in use at the Van Swinden Laboratory of the Netherlands Measurements Institute (NMi-VSL). The systems have in common that they enable both static and dynamic probe calibration using a laser interferometer. The displacements are generated using piezoelectric devices. Measurements are shown which illustrate the capabilities of the systems to characterize and calibrate fast-moving probes.",

author = "H. Haitjema and G.J.W.L. Kotte",

year = "1997",

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AU - Kotte, G.J.W.L.

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AB - This paper describes two systems for dynamic probe calibrations which are in use at the Van Swinden Laboratory of the Netherlands Measurements Institute (NMi-VSL). The systems have in common that they enable both static and dynamic probe calibration using a laser interferometer. The displacements are generated using piezoelectric devices. Measurements are shown which illustrate the capabilities of the systems to characterize and calibrate fast-moving probes.

U2 - 10.1016/S0263-2241(97)00052-3

DO - 10.1016/S0263-2241(97)00052-3

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EP - 111

JO - Measurement: Journal of the International Measurement Confederation

JF - Measurement: Journal of the International Measurement Confederation

SN - 0263-2241

IS - 3

ER -

Dynamic probe calibration up to 10 kHz using laser interferometry

Abstract

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