Dynamic probe calibration up to 10 kHz using laser interferometry

H. Haitjema, G.J.W.L. Kotte

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This paper describes two systems for dynamic probe calibrations which are in use at the Van Swinden Laboratory of the Netherlands Measurements Institute (NMi-VSL). The systems have in common that they enable both static and dynamic probe calibration using a laser interferometer. The displacements are generated using piezoelectric devices. Measurements are shown which illustrate the capabilities of the systems to characterize and calibrate fast-moving probes.
Original languageEnglish
Pages (from-to)107-111
JournalMeasurement: Journal of the International Measurement Confederation
Issue number3
Publication statusPublished - 1997


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