Dual focus wavefront tilting silicon nitride-based metalenses manufactured using deep-ultraviolet scanner lithography

David De Vocht (Corresponding author), Alonso Millan-Mejia, Angel Savov, Yuqing Jiao, Erwin Bente

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Abstract

We present a dual focus wavefront tilting metalens, a lens of a few micrometers thick that compensates for incidence angles of ±5° and focuses them to the same target. The metalens comprises an array of Si3N4 nanopillars. We manufactured the metalens using 193 nm deep-ultraviolet scanner lithography, suitable for high-volume manufacturing. Using this metalens, we demonstrate a proof-of-concept for chip-to-free-space coupling by directing light from one fibre collimator at +5° towards a mirror and recoupling this light into another fibre collimator at -5°. The metalens achieved a focusing efficiency of 9.4%. This efficiency has the potential to be improved to 64%. The metalens can be integrated into photonic circuits for enhanced coupling with distant objects. This work paves the way for further miniaturization of gas and metrology sensors.

Original languageEnglish
Pages (from-to)9187-9198
Number of pages12
JournalOptics Express
Volume33
Issue number5
DOIs
Publication statusPublished - 10 Mar 2025

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