TY - JOUR
T1 - Dual array 3D electron cyclotron emission imaging at ASDEX Upgrade a)
AU - Classen, I.G.J.
AU - Domier, C.W.
AU - Luhmann, N.C.
AU - Bogomolov, A.
AU - Suttrop, W.
AU - Boom, J.E.
AU - Tobias, B.J.
AU - Donné, A.J.H.
PY - 2014
Y1 - 2014
N2 - Contributed paper, published as part of the Proceedings of the 20th Topical Conference on High-Temperature Plasma Diagnostics, Atlanta, Georgia, USA, June 2014.
In a major upgrade, the (2D) electron cyclotron emission imaging diagnostic (ECEI) at ASDEX
Upgrade has been equipped with a second detector array, observing a different toroidal position in the plasma, to enable quasi-3D measurements of the electron temperature. The new system will measure a total of 288 channels, in two 2D arrays, toroidally separated by 40 cm. The two detector arrays observe the plasma through the same vacuum window, both under a slight toroidal angle. The majority of the field lines are observed by both arrays simultaneously, thereby enabling a direct measurement of the 3D properties of plasma instabilities like edge localized mode filaments. © 2014 AIP Publishing
LLC.
AB - Contributed paper, published as part of the Proceedings of the 20th Topical Conference on High-Temperature Plasma Diagnostics, Atlanta, Georgia, USA, June 2014.
In a major upgrade, the (2D) electron cyclotron emission imaging diagnostic (ECEI) at ASDEX
Upgrade has been equipped with a second detector array, observing a different toroidal position in the plasma, to enable quasi-3D measurements of the electron temperature. The new system will measure a total of 288 channels, in two 2D arrays, toroidally separated by 40 cm. The two detector arrays observe the plasma through the same vacuum window, both under a slight toroidal angle. The majority of the field lines are observed by both arrays simultaneously, thereby enabling a direct measurement of the 3D properties of plasma instabilities like edge localized mode filaments. © 2014 AIP Publishing
LLC.
U2 - 10.1063/1.4891061
DO - 10.1063/1.4891061
M3 - Article
C2 - 25430246
SN - 0034-6748
VL - 85
SP - 111D833-1/5
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
ER -