Abstract
Process-aware Information Systems (PAIS) have become ubiquitous in companies. Thus the amount of data that can be used to analyze and monitor process executions is vast. The event logs generated by PAIS might contain information about decision making processes and can support the understanding and improving of procedures in companies. Mining decisions and constraints from logs has already been investigated, but so far only for each instance in a separate manner. However, in many practical settings instances are connected to each other if they share, for example, the same resources. Therefore, we present an approach for discovering Instance-Spanning Constraints (ISC) from event logs. The main idea is to identify instance-spanning attributes in the logs and to separate the logs accordingly. Based on these projections, classification algorithms are applied in order to obtain ISC candidates. The feasibility and applicability of the approach is evaluated based on artificial as well as real-life logs. The discovered ISC candidates are then assessed by domain experts.
Original language | English |
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Title of host publication | Proceedings - 2017 IEEE 21st International Enterprise Distributed Object Computing Conference, EDOC 2017 |
Editors | Roger Villemaire, Robert Lagerstrom, Sylvain Halle |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 79-88 |
Number of pages | 10 |
ISBN (Electronic) | 9781509030453 |
DOIs | |
Publication status | Published - 2 Nov 2017 |
Externally published | Yes |
Event | 21st IEEE International Enterprise Distributed Object Computing Conference, EDOC 2017 - Quebec City, Canada Duration: 10 Oct 2017 → 13 Oct 2017 Conference number: 21 |
Conference
Conference | 21st IEEE International Enterprise Distributed Object Computing Conference, EDOC 2017 |
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Abbreviated title | EDOC 2017 |
Country/Territory | Canada |
City | Quebec City |
Period | 10/10/17 → 13/10/17 |
Funding
ACKNOWLEDGMENT This work has been funded by the Vienna Science and TechnologyFund (WWTF) through project ICT15-072.
Keywords
- Classification Techniques
- Constraint Mining
- Decision Mining
- Instance-Spanning Constraints