Direct probing of bulk and surface dangling bonds in a-Si:H by means of evanescent wave cavity ring down spectroscopy

M.C.M. Sanden, van de, I.M.P. Aarts, A.C.R. Pipino, W.M.M. Kessels

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationICANS 22 - abstract book : 22nd international conference on amorphous and nanocrystalline semiconductors : August 19-24, 2007, Breckenridge, Colorado, USA
EditorsE.A. Schiff, B. Nelson, H.M. Branz
PagesMoO9.2-
Publication statusPublished - 2007

Cite this

Sanden, van de, M. C. M., Aarts, I. M. P., Pipino, A. C. R., & Kessels, W. M. M. (2007). Direct probing of bulk and surface dangling bonds in a-Si:H by means of evanescent wave cavity ring down spectroscopy. In E. A. Schiff, B. Nelson, & H. M. Branz (Eds.), ICANS 22 - abstract book : 22nd international conference on amorphous and nanocrystalline semiconductors : August 19-24, 2007, Breckenridge, Colorado, USA (pp. MoO9.2-)