Diagnosing knowledge made within SME's

J.P. Vos; J.I.M. Halman; J.A. Keizer

Diagnosing knowledge made within SME's

J.P. Vos, J.I.M. Halman, J.A. Keizer

Innovation Technology Entrepreneurship & Marketing

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the 7th international forum on technology management
Editors	R. Hirasawa
Place of Publication	University of Tokyo, Tokyo
Publisher	National Institute of Science and Technology Policy
Pages	165-172
Publication status	Published - 1997
Event	conference; Kyoto, November 3-7, 1997 - Duration: 1 Jan 1997 → …

Conference

Conference	conference; Kyoto, November 3-7, 1997
Period	1/01/97 → …
Other	Kyoto, November 3-7, 1997

Cite this

@inproceedings{14f6762ea2044e43b50d2be69b06d487,

title = "Diagnosing knowledge made within SME's",

author = "J.P. Vos and J.I.M. Halman and J.A. Keizer",

year = "1997",

language = "English",

pages = "165--172",

editor = "R. Hirasawa",

booktitle = "Proceedings of the 7th international forum on technology management",

publisher = "National Institute of Science and Technology Policy",

note = "conference; Kyoto, November 3-7, 1997 ; Conference date: 01-01-1997",

}

Diagnosing knowledge made within SME's. / Vos, J.P.; Halman, J.I.M.; Keizer, J.A.

Proceedings of the 7th international forum on technology management. ed. / R. Hirasawa. University of Tokyo, Tokyo : National Institute of Science and Technology Policy, 1997. p. 165-172.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Diagnosing knowledge made within SME's

AU - Vos, J.P.

AU - Halman, J.I.M.

AU - Keizer, J.A.

PY - 1997

Y1 - 1997

M3 - Conference contribution

SP - 165

EP - 172

BT - Proceedings of the 7th international forum on technology management

A2 - Hirasawa, R.

PB - National Institute of Science and Technology Policy

CY - University of Tokyo, Tokyo

T2 - conference; Kyoto, November 3-7, 1997

Y2 - 1 January 1997

ER -