Diagnosing knowledge made within SME's

J.P. Vos, J.I.M. Halman, J.A. Keizer

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings of the 7th international forum on technology management
EditorsR. Hirasawa
Place of PublicationUniversity of Tokyo, Tokyo
PublisherNational Institute of Science and Technology Policy
Pages165-172
Publication statusPublished - 1997
Eventconference; Kyoto, November 3-7, 1997 -
Duration: 1 Jan 1997 → …

Conference

Conferenceconference; Kyoto, November 3-7, 1997
Period1/01/97 → …
OtherKyoto, November 3-7, 1997

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