Diagnosing Bridging Faults in Random Logic

S.C. Hora, W. Beverloo, M. Lousberg, M.T.M. Segers

    Research output: Contribution to conferencePaperAcademic

    Original languageEnglish
    Publication statusPublished - 2000
    Eventconference; 1st IEEE Int. Workshop on Yield Optimization and Test; 2000-12-05; 2000-12-06 -
    Duration: 5 Dec 20006 Dec 2000

    Conference

    Conferenceconference; 1st IEEE Int. Workshop on Yield Optimization and Test; 2000-12-05; 2000-12-06
    Period5/12/006/12/00
    Other1st IEEE Int. Workshop on Yield Optimization and Test

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