DfT for full accessibility of multi-step analog to digital converters.

A. Zjajo; J. Pineda de Gyvez

doi:10.1109/VDAT.2008.4542415

DfT for full accessibility of multi-step analog to digital converters.

A. Zjajo, J. Pineda de Gyvez

Electronic Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (Scopus)

353 Downloads (Pure)

Abstract

This paper reports a Design for Testability (DfT) technique, which provides necessary diagnostic capability for signature-based and functional testing of multi-step analog to digital converters. The proposed approach permits circuit re-configuration in such a way that all sub-blocks are tested for their full input range allowing full observability and controllability of the device under test. The proposed DfT can be used for engineering pre-characterization as well, and can easily be interfaced to standards like I2C and IEEE 1149.1 TAP controllers. Experimental evidence is provided on the 12 bit multi-step analog to digital converter fabricated in standard single poly, six metal 0.09-mum CMOS.

Original language	English
Title of host publication	VLSI Design, Automation and Test 2008, VLSI-DAT. IEEE International Symposium, 23-25-04-2008
Pages	73-76
DOIs	https://doi.org/10.1109/VDAT.2008.4542415
Publication status	Published - 2008

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10.1109/VDAT.2008.4542415

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title = "DfT for full accessibility of multi-step analog to digital converters.",

abstract = "This paper reports a Design for Testability (DfT) technique, which provides necessary diagnostic capability for signature-based and functional testing of multi-step analog to digital converters. The proposed approach permits circuit re-configuration in such a way that all sub-blocks are tested for their full input range allowing full observability and controllability of the device under test. The proposed DfT can be used for engineering pre-characterization as well, and can easily be interfaced to standards like I2C and IEEE 1149.1 TAP controllers. Experimental evidence is provided on the 12 bit multi-step analog to digital converter fabricated in standard single poly, six metal 0.09-mum CMOS.",

author = "A. Zjajo and {Pineda de Gyvez}, J.",

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doi = "10.1109/VDAT.2008.4542415",

language = "English",

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T1 - DfT for full accessibility of multi-step analog to digital converters.

AU - Zjajo, A.

AU - Pineda de Gyvez, J.

PY - 2008

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N2 - This paper reports a Design for Testability (DfT) technique, which provides necessary diagnostic capability for signature-based and functional testing of multi-step analog to digital converters. The proposed approach permits circuit re-configuration in such a way that all sub-blocks are tested for their full input range allowing full observability and controllability of the device under test. The proposed DfT can be used for engineering pre-characterization as well, and can easily be interfaced to standards like I2C and IEEE 1149.1 TAP controllers. Experimental evidence is provided on the 12 bit multi-step analog to digital converter fabricated in standard single poly, six metal 0.09-mum CMOS.

AB - This paper reports a Design for Testability (DfT) technique, which provides necessary diagnostic capability for signature-based and functional testing of multi-step analog to digital converters. The proposed approach permits circuit re-configuration in such a way that all sub-blocks are tested for their full input range allowing full observability and controllability of the device under test. The proposed DfT can be used for engineering pre-characterization as well, and can easily be interfaced to standards like I2C and IEEE 1149.1 TAP controllers. Experimental evidence is provided on the 12 bit multi-step analog to digital converter fabricated in standard single poly, six metal 0.09-mum CMOS.

U2 - 10.1109/VDAT.2008.4542415

DO - 10.1109/VDAT.2008.4542415

M3 - Conference contribution

SN - 978-1-4244-1616-5

SP - 73

EP - 76

BT - VLSI Design, Automation and Test 2008, VLSI-DAT. IEEE International Symposium, 23-25-04-2008

ER -

DfT for full accessibility of multi-step analog to digital converters.

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