Determining the input reflection coefficient of integrated antennas using over-the-air measurements under near-field conditions

A. J. Van Den Biggelaar (Corresponding author), D. P.P. Daverveld, A. C.F. Reniers, A.B. Smolders, U. Johannsen

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

One of the current trends in the integrated circuit (IC) development is the integration of antennas on-chip or in the package of the IC. This poses challenges in the production testing process of the packaged IC, as the antenna functionality has to be included and at least one of the signal ports cannot be accessed at a conducted manner. In order to measure the reflection coefficient of an integrated antenna, a contactless characterization method (CCM) can be used. In this paper, the practicality of a CCM is assessed, having the application of a costeffective high-volume testing procedure for integrated antennas in mind. It is shown that the CCM yields accurate results for different imperfections in the measurement setup. Moreover, measurement results around 33 GHz using a connectorized patch antenna are shown, which experimentally verify the validity of using the CCM under near-field conditions.

Original languageEnglish
JournalInternational Journal of Microwave and Wireless Technologies
VolumeXX
Issue numberX
DOIs
Publication statusE-pub ahead of print - 19 Nov 2020

Keywords

  • Antenna design
  • Integrated antennas
  • Microwave measurements
  • Modeling and measurements

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