Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers

S.K.J. Lenczowski; M.A.M. Gijs; R.J.M. van de Veerdonk; J.B. Giesbers; W.J.M. de Jonge

doi:10.1557/PROC-384-341

Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers

S.K.J. Lenczowski, M.A.M. Gijs, R.J.M. van de Veerdonk, J.B. Giesbers, W.J.M. de Jonge

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

15 Citations (Scopus)

Abstract

We present magnetoresistance (MR) data of high-vacuum magnetron sputtered NiFe/Cu multilayers (NiFe=NisoFe20) grown on Si(lOO) substrates with a Cu buffer layer and compare these with earlier results on Co/Cu(lOO) multilayers [1]. Measured MR values are directly proportional to the antiferromagnetically coupled fraction in the multilayers. Extrapolating to full antiparallel alignment, we can make a reliable comparison of the MR wrt,h the magnetoresistance model of Levy,
Zhang, and Fert [2,3]. For the NiFe/Cu multilayers the deduced spin-asymmetry parameters are a~iFe/Cu = 5.0 ± 0.4 and a~iFe = 2.1 ± 0.3 for interface and bulk scattering, respectively. Although much smaller than in our Co/Cu multilayers, where afo/Cu = 21 ± 3 and af0 = 2.6 ± 0.3, .it is still the spin dependence of the interface scattering that is the main cause for the large MR values.

Original language	English
Title of host publication	Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.
Editors	E.E. Marinero, B. Heinrich, W.F. Egelhoff
Place of Publication	Pitsburgh
Publisher	Materials Research Society
Pages	341-346
Number of pages	6
ISBN (Print)	1-55899-287-1
DOIs	https://doi.org/10.1557/PROC-384-341
Publication status	Published - 1 Dec 1995
Event	1995 MRS Spring Meeting - San Francisco, United States Duration: 18 Apr 1995 → 21 Apr 1995 https://www.mrs.org/spring1995

Publication series

Name	Materials Research Society Symposium - Proceedings
Volume	384
ISSN (Print)	0272-9172

Conference

Conference	1995 MRS Spring Meeting
Country/Territory	United States
City	San Francisco
Period	18/04/95 → 21/04/95
Internet address	https://www.mrs.org/spring1995

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10.1557/PROC-384-341

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Lenczowski, S. K. J., Gijs, M. A. M., van de Veerdonk, R. J. M., Giesbers, J. B., & de Jonge, W. J. M. (1995). Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers. In E. E. Marinero, B. Heinrich, & W. F. Egelhoff (Eds.), Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A. (pp. 341-346). (Materials Research Society Symposium - Proceedings; Vol. 384). Materials Research Society. https://doi.org/10.1557/PROC-384-341

Lenczowski, S.K.J. ; Gijs, M.A.M. ; van de Veerdonk, R.J.M. et al. / Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers. Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.. editor / E.E. Marinero ; B. Heinrich ; W.F. Egelhoff. Pitsburgh : Materials Research Society, 1995. pp. 341-346 (Materials Research Society Symposium - Proceedings).

@inproceedings{53e2ed4e9cea4d3ab6187950252e22ef,

title = "Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers",

abstract = "We present magnetoresistance (MR) data of high-vacuum magnetron sputtered NiFe/Cu multilayers (NiFe=NisoFe20) grown on Si(lOO) substrates with a Cu buffer layer and compare these with earlier results on Co/Cu(lOO) multilayers [1]. Measured MR values are directly proportional to the antiferromagnetically coupled fraction in the multilayers. Extrapolating to full antiparallel alignment, we can make a reliable comparison of the MR wrt,h the magnetoresistance model of Levy,Zhang, and Fert [2,3]. For the NiFe/Cu multilayers the deduced spin-asymmetry parameters are a~iFe/Cu = 5.0 ± 0.4 and a~iFe = 2.1 ± 0.3 for interface and bulk scattering, respectively. Although much smaller than in our Co/Cu multilayers, where afo/Cu = 21 ± 3 and af0 = 2.6 ± 0.3, .it is still the spin dependence of the interface scattering that is the main cause for the large MR values. ",

author = "S.K.J. Lenczowski and M.A.M. Gijs and {van de Veerdonk}, R.J.M. and J.B. Giesbers and {de Jonge}, W.J.M.",

year = "1995",

month = dec,

day = "1",

doi = "10.1557/PROC-384-341",

language = "English",

isbn = "1-55899-287-1",

series = "Materials Research Society Symposium - Proceedings",

publisher = "Materials Research Society",

pages = "341--346",

editor = "E.E. Marinero and B. Heinrich and W.F. Egelhoff",

booktitle = "Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.",

address = "United States",

note = "1995 MRS Spring Meeting ; Conference date: 18-04-1995 Through 21-04-1995",

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Lenczowski, SKJ, Gijs, MAM, van de Veerdonk, RJM, Giesbers, JB & de Jonge, WJM 1995, Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers. in EE Marinero, B Heinrich & WF Egelhoff (eds), Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.. Materials Research Society Symposium - Proceedings, vol. 384, Materials Research Society, Pitsburgh, pp. 341-346, 1995 MRS Spring Meeting, San Francisco, California, United States, 18/04/95. https://doi.org/10.1557/PROC-384-341

Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers. / Lenczowski, S.K.J.; Gijs, M.A.M.; van de Veerdonk, R.J.M. et al.
Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.. ed. / E.E. Marinero; B. Heinrich; W.F. Egelhoff. Pitsburgh: Materials Research Society, 1995. p. 341-346 (Materials Research Society Symposium - Proceedings; Vol. 384).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers

AU - Lenczowski, S.K.J.

AU - Gijs, M.A.M.

AU - van de Veerdonk, R.J.M.

AU - Giesbers, J.B.

AU - de Jonge, W.J.M.

PY - 1995/12/1

Y1 - 1995/12/1

N2 - We present magnetoresistance (MR) data of high-vacuum magnetron sputtered NiFe/Cu multilayers (NiFe=NisoFe20) grown on Si(lOO) substrates with a Cu buffer layer and compare these with earlier results on Co/Cu(lOO) multilayers [1]. Measured MR values are directly proportional to the antiferromagnetically coupled fraction in the multilayers. Extrapolating to full antiparallel alignment, we can make a reliable comparison of the MR wrt,h the magnetoresistance model of Levy,Zhang, and Fert [2,3]. For the NiFe/Cu multilayers the deduced spin-asymmetry parameters are a~iFe/Cu = 5.0 ± 0.4 and a~iFe = 2.1 ± 0.3 for interface and bulk scattering, respectively. Although much smaller than in our Co/Cu multilayers, where afo/Cu = 21 ± 3 and af0 = 2.6 ± 0.3, .it is still the spin dependence of the interface scattering that is the main cause for the large MR values.

AB - We present magnetoresistance (MR) data of high-vacuum magnetron sputtered NiFe/Cu multilayers (NiFe=NisoFe20) grown on Si(lOO) substrates with a Cu buffer layer and compare these with earlier results on Co/Cu(lOO) multilayers [1]. Measured MR values are directly proportional to the antiferromagnetically coupled fraction in the multilayers. Extrapolating to full antiparallel alignment, we can make a reliable comparison of the MR wrt,h the magnetoresistance model of Levy,Zhang, and Fert [2,3]. For the NiFe/Cu multilayers the deduced spin-asymmetry parameters are a~iFe/Cu = 5.0 ± 0.4 and a~iFe = 2.1 ± 0.3 for interface and bulk scattering, respectively. Although much smaller than in our Co/Cu multilayers, where afo/Cu = 21 ± 3 and af0 = 2.6 ± 0.3, .it is still the spin dependence of the interface scattering that is the main cause for the large MR values.

U2 - 10.1557/PROC-384-341

DO - 10.1557/PROC-384-341

M3 - Conference contribution

SN - 1-55899-287-1

T3 - Materials Research Society Symposium - Proceedings

SP - 341

EP - 346

BT - Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.

A2 - Marinero, E.E.

A2 - Heinrich, B.

A2 - Egelhoff, W.F.

PB - Materials Research Society

CY - Pitsburgh

T2 - 1995 MRS Spring Meeting

Y2 - 18 April 1995 through 21 April 1995

ER -

Lenczowski SKJ, Gijs MAM, van de Veerdonk RJM, Giesbers JB, de Jonge WJM. Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers. In Marinero EE, Heinrich B, Egelhoff WF, editors, Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A.. Pitsburgh: Materials Research Society. 1995. p. 341-346. (Materials Research Society Symposium - Proceedings). doi: 10.1557/PROC-384-341

Determination of spin-dependent scattering parameters of NiFe/Cu and Co/Cu multilayers

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