Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering

H. Téllez, R.J. Chater, S. Fearn, E. Symianakis, H.H. Brongersma, J.A. Kilner

Research output: Contribution to journalArticleAcademicpeer-review

12 Citations (Scopus)
96 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering'. Together they form a unique fingerprint.

Engineering

Chemistry

Material Science

Physics