Detection of picosecond electrical transients in a scanning tunneling microscope

R.H.M. Groeneveld, T.H.M. Rasing, L.M.F. Kaufmann, E. Smalbrugge, J.H. Wolter, M.R. Melloch, H. Kempen, van

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Abstract

We have developed a scanning tunneling microscope using an optoelectronic switch which gates the tunneling tip current. The switch is fabricated within several tens of microns from the tip by photolithography and an accurate cleavage method. We demonstrate this approach by detecting picosecond electrical transients on a coplanar stripline. We have investigated the signal dependence on contact resistance and found significant differences when the tip is brought from low-ohmic contact into the tunneling regime.
Original languageEnglish
Pages (from-to)294-296
Number of pages3
JournalPhysica B: Condensed Matter
Volume218
Issue number1-4
DOIs
Publication statusPublished - 1996

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