Design of a Calibration Platform for Scanning Probe Microscopes and Other Probing Systems

H.A.M. Steijaert, H. Haitjema

Research output: Contribution to journalArticleProfessional

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Abstract

We designed a calibration platformthat enables the calibration of a scanning probe microscope (SPM)
Original languageEnglish
Pages (from-to)19-22
JournalCal Lab
Volume2
Publication statusPublished - 1995

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