A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.
|Title of host publication||Proceedings 23rd Conference on Design Automation, 29 May-2 June, 1986|
|Publication status||Published - 1986|