Design and validation of fault-tolerant embedded controllers

Saurav Kumar Ghosh, Soumyajjit Dey, Dip Goswami, Daniel Mueller-Gritschneder, Samarjit Chakraborty

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Abstract

Embedded control systems are an important and often safety-critical class of applications that need to operate reliably even in the presence of faults. We show that intermittent fault scenarios caused by wear-out effects due to a higher density and a smaller geometry of the embedded electronic components may become a reliability concern for real-time embedded control applications. To mitigate the effects of such intermittent faults, we propose a novel fault-tolerant controller design method such that the resulting controllers ensure closed loop stability (i.e., guarantee safety) with only possibly degraded performance under such fault scenarios. In order to measure the amortized performance offered by the software implementations of such fault-tolerant controllers, we provide a program analysis methodology that statically estimates the quality of control guaranteed by the C code implementation of the fault-tolerant control law. This combination of fault-tolerant controller design followed by performance feedback computed using a formal analysis is illustrated with a case study from the automotive domain.

Original languageEnglish
Title of host publicationProceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
PublisherInstitute of Electrical and Electronics Engineers
Pages1283-1288
Number of pages6
Volume2018-January
ISBN (Electronic)9783981926316
DOIs
Publication statusPublished - 19 Apr 2018
Event21st Design, Automation and Test in Europe Conference and Exhibition (DATE 2018) - Dresden, Germany
Duration: 19 Mar 201823 Mar 2018
Conference number: 21
https://www.date-conference.com/date18/

Conference

Conference21st Design, Automation and Test in Europe Conference and Exhibition (DATE 2018)
Abbreviated titleDATE 2018
CountryGermany
CityDresden
Period19/03/1823/03/18
Internet address

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Cite this

Ghosh, S. K., Dey, S., Goswami, D., Mueller-Gritschneder, D., & Chakraborty, S. (2018). Design and validation of fault-tolerant embedded controllers. In Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 (Vol. 2018-January, pp. 1283-1288). Institute of Electrical and Electronics Engineers. https://doi.org/10.23919/DATE.2018.8342212