A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is described. The method uses derivative-free optimization in order to find a global optimum of an image variance, which is an image quality measure. The Nelder-Mead simplex method and the Powell interpolation-based trust-region method are discussed and compared for an application running on a scanning transmission electron microscope.
|Place of Publication||Eindhoven|
|Publisher||Technische Universiteit Eindhoven|
|Number of pages||10|
|Publication status||Published - 2010|