Derivative-free optimization for autofocus and astigmatism correction in electron microscopy

M. Rudnaya, S.C. Kho, R.M.M. Mattheij, J.M.L. Maubach

Research output: Book/ReportReportAcademic

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Abstract

A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is described. The method uses derivative-free optimization in order to find a global optimum of an image variance, which is an image quality measure. The Nelder-Mead simplex method and the Powell interpolation-based trust-region method are discussed and compared for an application running on a scanning transmission electron microscope.
Original languageEnglish
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Number of pages10
Publication statusPublished - 2010

Publication series

NameCASA-report
Volume1034
ISSN (Print)0926-4507

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