Abstract
This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these emerging devices inherently suffering from many non-idealities are calling for new solutions in order to ensure accurate and reliable edge computing. Moreover, the paper also covers the security aspects for future edge processors and shows the challenges and the future directions.
Original language | English |
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Title of host publication | 2023 IEEE European Test Symposium (ETS) |
Publisher | Institute of Electrical and Electronics Engineers |
Number of pages | 6 |
ISBN (Electronic) | 979-8-3503-3634-4 |
DOIs | |
Publication status | Published - 12 Jul 2023 |
Event | 28th IEEE European Test Symposium, ETS 2023 - Venice, Italy Duration: 22 May 2023 → 26 May 2023 |
Conference
Conference | 28th IEEE European Test Symposium, ETS 2023 |
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Country/Territory | Italy |
City | Venice |
Period | 22/05/23 → 26/05/23 |
Funding
This work is funded by EU’s Horizon Europe research and innovation programme under grant agreement No. 101070374.
Funders | Funder number |
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European Union's Horizon 2020 - Research and Innovation Framework Programme | 101070374 |
Keywords
- DSE
- SoC
- ULP
- approximate computing
- compiler stack
- dynamic DL
- edge-AI
- memristor