Projects per year
Abstract
We report a first exploration of High-angular-Resolution Electron Backscatter Diffraction, without using simulated Electron Backscatter Diffraction patterns as a reference, for absolute stress and orientation measurements in polycrystalline materials. By co-correlating the pattern center and fully exploiting crystal symmetry and plane-stress, simultaneous correlation of all overlapping regions of interest in multiple direct-electron-detector, energy-filtered Electron Backscatter Diffraction patterns is achieved. The potential for highly accurate measurement of absolute stress, crystal orientation and pattern center is demonstrated on a virtual polycrystalline case-study, showing errors respectively below 20 MPa (or 10−4 in strain), 7 × 10−5 rad and 0.06 pixels.
Original language | English |
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Pages (from-to) | 266-271 |
Number of pages | 6 |
Journal | Scripta Materialia |
Volume | 162 |
DOIs | |
Publication status | Published - 15 Mar 2019 |
Keywords
- Absolute stress
- Crystal symmetry
- EBSD
- Grain boundaries
- HR-EBSD
- Pattern center
Fingerprint
Dive into the research topics of 'Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction'. Together they form a unique fingerprint.Projects
- 1 Finished
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Unraveling the effect of microstructure statistics on failure of multiphase steels NWO-TTW/HTM 16348
Hoefnagels, J. P. M. (Project Manager), van Maris, M. P. F. H. L. (Project member), Vermeij, T. (Project member) & Wijnen, J. (Project member)
1/01/18 → 31/12/22
Project: Research direct
Prizes
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2019 Acta Student Award
Vermeij, T. (Recipient), Jul 2020
Prize: Other › Career, activity or publication related prizes (lifetime, best paper, poster etc.) › Scientific
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2nd Prize Michael Sutton International Student Competition, SEM Conference 2019
Vermeij, T. (Recipient), Jun 2019
Prize: Other › Career, activity or publication related prizes (lifetime, best paper, poster etc.) › Scientific
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2nd Prize Poster Competition, the annual EBSD meeting of the Royal Microscopy Society 2018
Vermeij, T. (Recipient), Apr 2018
Prize: Other › Career, activity or publication related prizes (lifetime, best paper, poster etc.) › Scientific
Equipment
Research output
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A consistent full-field integrated DIC framework for HR-EBSD
Vermeij, T. & Hoefnagels, J. P. M., 1 Aug 2018, In: Ultramicroscopy. 191, p. 44-50 7 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile37 Citations (Scopus)265 Downloads (Pure) -
Can we use electrons to measure local stresses in polycrystalline materials?
Vermeij, T. & Hoefnagels, J. P. M., 13 Dec 2018.Research output: Contribution to conference › Poster
Open AccessFile