Delta n=0.22 birefringence measurement by surface emitting second harmonic generation in selectively oxidized GaAs/AlAs optical waveguides

A. Fiore; V. Berger; E. Rosencher; S. Crouzy; N. Laurent; J. Nagle

doi:10.1063/1.119336

Delta n=0.22 birefringence measurement by surface emitting second harmonic generation in selectively oxidized GaAs/AlAs optical waveguides

A. Fiore, V. Berger, E. Rosencher, S. Crouzy, N. Laurent, J. Nagle

Photonics and Semiconductor Nanophysics

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Abstract

The authors have measured the birefringence enhancement due to lateral selective oxidn. of AlAs in GaAs/AlAs optical waveguides. The birefringence was measured by imaging the surface-emitted 2nd harmonic generated by the nonlinear interaction of counterpropagating TE and TM modes. In a waveguide contg. a single AlAs layer the birefringence is enhanced from Delta n = 0.017 (before oxidn.) to Delta n = 0.038 (after oxidn.). In an oxidized multilayer GaAs/AlAs waveguide, a birefringence as high as Delta n = 0.22 is measured. This birefringence is sufficient to phase-match the difference frequency generation of 3-5 micro m IR radiation from 2 near-IR pumps. [on SciFinder (R)]

Original language	English
Pages (from-to)	2587-2589
Number of pages	3
Journal	Applied Physics Letters
Volume	71
Issue number	18
DOIs	https://doi.org/10.1063/1.119336
Publication status	Published - 1997

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title = "Delta n=0.22 birefringence measurement by surface emitting second harmonic generation in selectively oxidized GaAs/AlAs optical waveguides",

abstract = "The authors have measured the birefringence enhancement due to lateral selective oxidn. of AlAs in GaAs/AlAs optical waveguides. The birefringence was measured by imaging the surface-emitted 2nd harmonic generated by the nonlinear interaction of counterpropagating TE and TM modes. In a waveguide contg. a single AlAs layer the birefringence is enhanced from Delta n = 0.017 (before oxidn.) to Delta n = 0.038 (after oxidn.). In an oxidized multilayer GaAs/AlAs waveguide, a birefringence as high as Delta n = 0.22 is measured. This birefringence is sufficient to phase-match the difference frequency generation of 3-5 micro m IR radiation from 2 near-IR pumps. [on SciFinder (R)]",

author = "A. Fiore and V. Berger and E. Rosencher and S. Crouzy and N. Laurent and J. Nagle",

year = "1997",

doi = "10.1063/1.119336",

language = "English",

volume = "71",

pages = "2587--2589",

journal = "Applied Physics Letters",

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publisher = "American Institute of Physics",

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T1 - Delta n=0.22 birefringence measurement by surface emitting second harmonic generation in selectively oxidized GaAs/AlAs optical waveguides

AU - Fiore, A.

AU - Berger, V.

AU - Rosencher, E.

AU - Crouzy, S.

AU - Laurent, N.

AU - Nagle, J.

PY - 1997

Y1 - 1997

N2 - The authors have measured the birefringence enhancement due to lateral selective oxidn. of AlAs in GaAs/AlAs optical waveguides. The birefringence was measured by imaging the surface-emitted 2nd harmonic generated by the nonlinear interaction of counterpropagating TE and TM modes. In a waveguide contg. a single AlAs layer the birefringence is enhanced from Delta n = 0.017 (before oxidn.) to Delta n = 0.038 (after oxidn.). In an oxidized multilayer GaAs/AlAs waveguide, a birefringence as high as Delta n = 0.22 is measured. This birefringence is sufficient to phase-match the difference frequency generation of 3-5 micro m IR radiation from 2 near-IR pumps. [on SciFinder (R)]

AB - The authors have measured the birefringence enhancement due to lateral selective oxidn. of AlAs in GaAs/AlAs optical waveguides. The birefringence was measured by imaging the surface-emitted 2nd harmonic generated by the nonlinear interaction of counterpropagating TE and TM modes. In a waveguide contg. a single AlAs layer the birefringence is enhanced from Delta n = 0.017 (before oxidn.) to Delta n = 0.038 (after oxidn.). In an oxidized multilayer GaAs/AlAs waveguide, a birefringence as high as Delta n = 0.22 is measured. This birefringence is sufficient to phase-match the difference frequency generation of 3-5 micro m IR radiation from 2 near-IR pumps. [on SciFinder (R)]

U2 - 10.1063/1.119336

DO - 10.1063/1.119336

M3 - Article

SN - 0003-6951

VL - 71

SP - 2587

EP - 2589

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

ER -

Delta n=0.22 birefringence measurement by surface emitting second harmonic generation in selectively oxidized GaAs/AlAs optical waveguides

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