Delamination modeling of three-dimensional microelectronic systems

O. Sluis, van der, P.H.M. Timmermans, R.B.R. Silfhout, van, W.D. Driel, van, G.Q. Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Delamination modeling of three-dimensional microelectronic systems'. Together they form a unique fingerprint.

Engineering & Materials Science