@inproceedings{9ffe7faef046454b811c7a652e0dad0a,
title = "Defect density measurements of a-Si:H by means of the cavity ring down absorption technique",
author = "A.H.M. Smets and \{van Helden\}, J.H. and \{van de Sanden\}, M.C.M.",
year = "2001",
language = "English",
pages = "241--244",
booktitle = "Proceedings of Frontiers in Low Temperature Plasma Diagnostics IV",
publisher = "Eindhoven University of Technology",
note = "Frontiers in Low Temperature Plasma Diagnostics IV ; Conference date: 25-03-2001 Through 29-03-2001",
}