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Deep learning based phase retrieval with complex beam shapes for beam shape correction

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

Beam shaping in laser-based additive manufacturing can enhance printing speed and printed part properties. Complex beam shapes in the Fourier plane are produced by beam shaping systems by modulating the phase in the pupil plane with a phase mask. However, the phase mask may suffer deviations due to heat, etc., leading to a distorted beam shape. This paper provides a solution for phase retrieval with complex beam shapes for beam shape correction. Based on the distorted beam shape, a deep learning model identifies the aberrations represented with Zernike coefficients, which are subsequently used to correct the beam shape. We benchmark the employed computer vision deep learning models against SOTA phase retrieval methods on different beam shapes. Results show that the employed models outperform state-of-the-art methods in aberration detection and beam shape correction on simulated data.
Original languageEnglish
Pages (from-to)10806-10834
Number of pages29
JournalOptics Express
Volume33
Issue number5
DOIs
Publication statusPublished - 10 Mar 2025

Funding

This work was supported by the EU InShaPe project funded by the European Union (EU Funding Nr.: 101058523 — InShaPe) under HORIZON EUROPE Framework Programme (7.2 Million €).

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 9 - Industry, Innovation, and Infrastructure
    SDG 9 Industry, Innovation, and Infrastructure
  2. SDG 12 - Responsible Consumption and Production
    SDG 12 Responsible Consumption and Production

Keywords

  • phase retrieval
  • beam shaping
  • Additive manufacturing (AM)
  • High-power solid-state laser
  • Fourier optics
  • computational optics
  • spatial light modulator
  • Zernike Polynomals
  • deep learning benchmark
  • scientific computing
  • aberration correction
  • PBF-LB/M
  • Simulation-based training
  • Simulation-based assessment
  • artificial intelligence (AI)
  • Computer vision and pattern recognition
  • image processing

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