Dedicated FIB preparation for TEM cross-section samples of nanowires grown vertically on silicon substrates

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Original language	English
Pages (from-to)	504-505
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606064750
Publication status	Published - 2006

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@article{135a1794102d42d39639bd7624f9c855,

title = "Dedicated FIB preparation for TEM cross-section samples of nanowires grown vertically on silicon substrates",

author = "M. Kaiser and M.A. Verheijen and A.L. Roest and E.P.A.M. Bakkers",

year = "2006",

doi = "10.1017/S1431927606064750",

language = "English",

volume = "12",

pages = "504--505",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Dedicated FIB preparation for TEM cross-section samples of nanowires grown vertically on silicon substrates

AU - Kaiser, M.

AU - Verheijen, M.A.

AU - Roest, A.L.

AU - Bakkers, E.P.A.M.

PY - 2006

Y1 - 2006

U2 - 10.1017/S1431927606064750

DO - 10.1017/S1431927606064750

M3 - Article

SN - 1431-9276

VL - 12

SP - 504

EP - 505

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -