Dedicated FIB preparation for TEM cross-section samples of nanowires grown vertically on silicon substrates

M. Kaiser, M.A. Verheijen, A.L. Roest, E.P.A.M. Bakkers

Research output: Contribution to journalArticleAcademicpeer-review

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Original languageEnglish
Pages (from-to)504-505
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 2006

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