Decreasing the sensitivity of ADC test parameters by means of wobbling

R. De Vries; A.J.E.M. Janssen

doi:10.1109/VTEST.1998.670894

Decreasing the sensitivity of ADC test parameters by means of wobbling

R. De Vries, A.J.E.M. Janssen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (SciVal)

Abstract

In this paper we propose a new technique, wobbling, for the stabilization of spectral ADC-test parameters with respect to offset and amplitude deviations of the sinusoidal stimulus. Wobbling aims at removing the effect of the rounding operation that takes place in an ADC, so that the measured harmonic distortion and noise amplitude can be truly ascribed to the intrinsic non-linearity and noise of the ADC. We compare the wobbling technique with subtractive and non-subtractive noise dithering, both from a performance and an implementation point-of-view. We present results of simulations and measurements validating the wobbling technique for use in a production environment.

Original language	English
Title of host publication	16th IEEE VLSI Test Symposium
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	386-391
Number of pages	6
ISBN (Print)	0-8186-8436-4
DOIs	https://doi.org/10.1109/VTEST.1998.670894
Publication status	Published - 1 Dec 1998
Externally published	Yes
Event	1998 16th IEEE VLSI Test Symposium - Monterey, CA, USA Duration: 26 Apr 1998 → 30 Apr 1998

Conference

Conference	1998 16th IEEE VLSI Test Symposium
City	Monterey, CA, USA
Period	26/04/98 → 30/04/98

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10.1109/VTEST.1998.670894

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title = "Decreasing the sensitivity of ADC test parameters by means of wobbling",

abstract = "In this paper we propose a new technique, wobbling, for the stabilization of spectral ADC-test parameters with respect to offset and amplitude deviations of the sinusoidal stimulus. Wobbling aims at removing the effect of the rounding operation that takes place in an ADC, so that the measured harmonic distortion and noise amplitude can be truly ascribed to the intrinsic non-linearity and noise of the ADC. We compare the wobbling technique with subtractive and non-subtractive noise dithering, both from a performance and an implementation point-of-view. We present results of simulations and measurements validating the wobbling technique for use in a production environment.",

author = "{De Vries}, R. and A.J.E.M. Janssen",

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booktitle = "16th IEEE VLSI Test Symposium",

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T1 - Decreasing the sensitivity of ADC test parameters by means of wobbling

AU - De Vries, R.

AU - Janssen, A.J.E.M.

PY - 1998/12/1

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N2 - In this paper we propose a new technique, wobbling, for the stabilization of spectral ADC-test parameters with respect to offset and amplitude deviations of the sinusoidal stimulus. Wobbling aims at removing the effect of the rounding operation that takes place in an ADC, so that the measured harmonic distortion and noise amplitude can be truly ascribed to the intrinsic non-linearity and noise of the ADC. We compare the wobbling technique with subtractive and non-subtractive noise dithering, both from a performance and an implementation point-of-view. We present results of simulations and measurements validating the wobbling technique for use in a production environment.

AB - In this paper we propose a new technique, wobbling, for the stabilization of spectral ADC-test parameters with respect to offset and amplitude deviations of the sinusoidal stimulus. Wobbling aims at removing the effect of the rounding operation that takes place in an ADC, so that the measured harmonic distortion and noise amplitude can be truly ascribed to the intrinsic non-linearity and noise of the ADC. We compare the wobbling technique with subtractive and non-subtractive noise dithering, both from a performance and an implementation point-of-view. We present results of simulations and measurements validating the wobbling technique for use in a production environment.

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U2 - 10.1109/VTEST.1998.670894

DO - 10.1109/VTEST.1998.670894

M3 - Conference contribution

AN - SCOPUS:0032316343

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EP - 391

BT - 16th IEEE VLSI Test Symposium

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - 1998 16th IEEE VLSI Test Symposium

Y2 - 26 April 1998 through 30 April 1998

ER -

Decreasing the sensitivity of ADC test parameters by means of wobbling

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