Decreasing the sensitivity of ADC test parameters by means of wobbling

R. De Vries, A.J.E.M. Janssen

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Abstract

In this paper we propose a new technique, wobbling, for the stabilization of spectral ADC-test parameters with respect to offset and amplitude deviations of the sinusoidal stimulus. Wobbling aims at removing the effect of the rounding operation that takes place in an ADC, so that the measured harmonic distortion and noise amplitude can be truly ascribed to the intrinsic non-linearity and noise of the ADC. We compare the wobbling technique with subtractive and non-subtractive noise dithering, both from a performance and an implementation point-of-view. We present results of simulations and measurements validating the wobbling technique for use in a production environment.

Original languageEnglish
Title of host publication16th IEEE VLSI Test Symposium
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages386-391
Number of pages6
ISBN (Print)0-8186-8436-4
DOIs
Publication statusPublished - 1 Dec 1998
Externally publishedYes
Event1998 16th IEEE VLSI Test Symposium - Monterey, CA, USA
Duration: 26 Apr 199830 Apr 1998

Conference

Conference1998 16th IEEE VLSI Test Symposium
CityMonterey, CA, USA
Period26/04/9830/04/98

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