| Original language | English |
|---|---|
| Title of host publication | Proceedings ISCAS '93, 1993 IEEE International Symposium Chicago, USA, 3-6 May 1993 |
| Pages | 1337-1340 |
| Publication status | Published - 1993 |
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DC testing of analog integrated circuits with piecewise linear approximation and interval analysis
- D.M.W. Leenaerts
- , J. Spaandonk, van
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
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