DC testing of analog integrated circuits with piecewise linear approximation and interval analysis

D.M.W. Leenaerts, J. Spaandonk, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
99 Downloads (Pure)
Original languageEnglish
Title of host publicationProceedings ISCAS '93, 1993 IEEE International Symposium Chicago, USA, 3-6 May 1993
Pages1337-1340
Publication statusPublished - 1993

Cite this

Leenaerts, D. M. W., & Spaandonk, van, J. (1993). DC testing of analog integrated circuits with piecewise linear approximation and interval analysis. In Proceedings ISCAS '93, 1993 IEEE International Symposium Chicago, USA, 3-6 May 1993 (pp. 1337-1340)