DC testing of analog integrated circuits with piecewise linear approximation and interval analysis

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

232 Downloads (Pure)

Original language	English
Title of host publication	Proceedings ISCAS '93, 1993 IEEE International Symposium Chicago, USA, 3-6 May 1993
Pages	1337-1340
Publication status	Published - 1993

Access to Document

@inproceedings{ae678a0825934f49a8d6261c3482a6a1,

title = "DC testing of analog integrated circuits with piecewise linear approximation and interval analysis",

author = "D.M.W. Leenaerts and {Spaandonk, van}, J.",

year = "1993",

language = "English",

isbn = "0-7803-1281-3",

pages = "1337--1340",

booktitle = "Proceedings ISCAS '93, 1993 IEEE International Symposium Chicago, USA, 3-6 May 1993",

}