DC testing of analog integrated circuits with piecewise linear approximation and interval analysis

D.M.W. Leenaerts, J. Spaandonk, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
252 Downloads (Pure)
Original languageEnglish
Title of host publicationProceedings ISCAS '93, 1993 IEEE International Symposium Chicago, USA, 3-6 May 1993
Publication statusPublished - 1993

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