Cycle time distributions of semiconductor workstations using aggregate modeling

C.P.L. Veeger, L.F.P. Etman, J.E. Rooda, J. van Herk

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)
2 Downloads (Pure)


Recently an aggregate modeling method has been developed to predict cycle time distributions as a function of throughput for manufacturing workstations with dispatching. The aggregate model is a single-server representation of the workstation with a workload-dependent process time distribution, and a workload-dependent overtaking distribution. The process time and overtaking distribution can be determined from arrival and departure events measured from the workstation at the factory floor. In this paper, we validate the proposed method in the context of semiconductor manufacturing. In particular weconsider a lithography workstation. First, we present a simulation case that demonstrates the accuracy of the aggregate model to predict cycle time distributions. Second, we apply the aggregate modeling method to a case from semiconductor industry,and illustrate how the method performs using arrival and departure data obtained from the manufacturing execution system.
Original languageEnglish
Title of host publicationProceedings of the 2009 Winter Simulation Conference (WSC 2009), 13-16 December 2009, Austin, Texas, USA
EditorsM.D. Rosetti, R.R. Hill, A. Johansson, A Dunkin, R.G. Ingalls
Place of PublicationUnited States, Austin, Texas
PublisherInstitute of Electrical and Electronics Engineers
Publication statusPublished - 2009


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