Current distribution during HV and MV faults in LV systems

J.B.M. Waes, van; A.P.J. Deursen, van; F. Provoost; M.J.M. van Riet; J.F.G. Cobben

Current distribution during HV and MV faults in LV systems

J.B.M. Waes, van
, A.P.J. Deursen, van
, F. Provoost
, M.J.M. van Riet
, J.F.G. Cobben

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Workshop on EMC Measurement Techniques for Complex and Distributed System, Lille, France
Publication status	Published - 2001
Event	Workshop on EMC Measurement Techniques for Complex and Distributed Systems, June 11-12, 2001, Lille, France - Lille, France Duration: 11 Jun 2001 → 12 Jun 2001

Workshop

Workshop	Workshop on EMC Measurement Techniques for Complex and Distributed Systems, June 11-12, 2001, Lille, France
Country/Territory	France
City	Lille
Period	11/06/01 → 12/06/01

Cite this

@inproceedings{fa24528f76db4977b325e0bbef5aa21b,

title = "Current distribution during HV and MV faults in LV systems",

author = "\{Waes, van\}, J.B.M. and \{Deursen, van\}, A.P.J. and F. Provoost and \{van Riet\}, M.J.M. and J.F.G. Cobben",

year = "2001",

language = "English",

booktitle = "Workshop on EMC Measurement Techniques for Complex and Distributed System, Lille, France",

note = "Workshop on EMC Measurement Techniques for Complex and Distributed Systems, June 11-12, 2001, Lille, France ; Conference date: 11-06-2001 Through 12-06-2001",

}

TY - GEN

T1 - Current distribution during HV and MV faults in LV systems

AU - Waes, van, J.B.M.

AU - Deursen, van, A.P.J.

AU - Provoost, F.

AU - van Riet, M.J.M.

AU - Cobben, J.F.G.

PY - 2001

Y1 - 2001

M3 - Conference contribution

BT - Workshop on EMC Measurement Techniques for Complex and Distributed System, Lille, France

T2 - Workshop on EMC Measurement Techniques for Complex and Distributed Systems, June 11-12, 2001, Lille, France

Y2 - 11 June 2001 through 12 June 2001

ER -