Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging

Marie Ingrid Richard, Sara Fernández, Joël Eymery, Jan Philipp Hofmann, Lu Gao, Jérôme Carnis, Stéphane Labat, Vincent Favre-Nicolin, Emiel J.M. Hensen, Olivier Thomas, Tobias U. Schülli, Steven J. Leake

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Abstract

The physical and chemical properties of nanostructures depend on their surface facets. Here, we exploit a pole figure approach to determine the three-dimensional orientation matrix of a nanostructure from a single Bragg reflection measured with a coherent nano-focused X-ray beam. The signature of any truncated (faceted) crystal produces a crystal truncation rod, which corresponds to a streak of intensity in reciprocal space normal to the surface. When two or more non-parallel facets are present, both the crystal orientation and the crystal facets can be identified. This enables facets to be rapidly indexed and uncommon facets, and planar defects, that have been difficult to study before to be identified. We demonstrate the technique with (i) epitaxial core-shell InGaN/GaN multiple quantum-wells grown on GaN nanowires, where surface facets and planar defects are determined, and (ii) single randomly oriented highly faceted tetrahedrahexal Pt nanoparticles. The methodology is applicable to a broad range of nanocrystals and provides a unique insight into the connection between structure and properties of nanomaterials.

Original languageEnglish
Pages (from-to)4833-4840
Number of pages8
JournalNanoscale
Volume10
Issue number10
DOIs
Publication statusPublished - 14 Mar 2018

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Nanostructures
Imaging techniques
X rays
Defects
Crystals
Nanostructured materials
Crystal orientation
Nanocrystals
Chemical properties
Semiconductor quantum wells
Nanowires
Poles
Physical properties
Nanoparticles

Cite this

Richard, Marie Ingrid ; Fernández, Sara ; Eymery, Joël ; Hofmann, Jan Philipp ; Gao, Lu ; Carnis, Jérôme ; Labat, Stéphane ; Favre-Nicolin, Vincent ; Hensen, Emiel J.M. ; Thomas, Olivier ; Schülli, Tobias U. ; Leake, Steven J. / Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging. In: Nanoscale. 2018 ; Vol. 10, No. 10. pp. 4833-4840.
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abstract = "The physical and chemical properties of nanostructures depend on their surface facets. Here, we exploit a pole figure approach to determine the three-dimensional orientation matrix of a nanostructure from a single Bragg reflection measured with a coherent nano-focused X-ray beam. The signature of any truncated (faceted) crystal produces a crystal truncation rod, which corresponds to a streak of intensity in reciprocal space normal to the surface. When two or more non-parallel facets are present, both the crystal orientation and the crystal facets can be identified. This enables facets to be rapidly indexed and uncommon facets, and planar defects, that have been difficult to study before to be identified. We demonstrate the technique with (i) epitaxial core-shell InGaN/GaN multiple quantum-wells grown on GaN nanowires, where surface facets and planar defects are determined, and (ii) single randomly oriented highly faceted tetrahedrahexal Pt nanoparticles. The methodology is applicable to a broad range of nanocrystals and provides a unique insight into the connection between structure and properties of nanomaterials.",
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Richard, MI, Fernández, S, Eymery, J, Hofmann, JP, Gao, L, Carnis, J, Labat, S, Favre-Nicolin, V, Hensen, EJM, Thomas, O, Schülli, TU & Leake, SJ 2018, 'Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging', Nanoscale, vol. 10, no. 10, pp. 4833-4840. https://doi.org/10.1039/C7NR07990G

Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging. / Richard, Marie Ingrid; Fernández, Sara; Eymery, Joël; Hofmann, Jan Philipp; Gao, Lu; Carnis, Jérôme; Labat, Stéphane; Favre-Nicolin, Vincent; Hensen, Emiel J.M.; Thomas, Olivier; Schülli, Tobias U.; Leake, Steven J.

In: Nanoscale, Vol. 10, No. 10, 14.03.2018, p. 4833-4840.

Research output: Contribution to journalArticleAcademicpeer-review

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AU - Richard, Marie Ingrid

AU - Fernández, Sara

AU - Eymery, Joël

AU - Hofmann, Jan Philipp

AU - Gao, Lu

AU - Carnis, Jérôme

AU - Labat, Stéphane

AU - Favre-Nicolin, Vincent

AU - Hensen, Emiel J.M.

AU - Thomas, Olivier

AU - Schülli, Tobias U.

AU - Leake, Steven J.

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N2 - The physical and chemical properties of nanostructures depend on their surface facets. Here, we exploit a pole figure approach to determine the three-dimensional orientation matrix of a nanostructure from a single Bragg reflection measured with a coherent nano-focused X-ray beam. The signature of any truncated (faceted) crystal produces a crystal truncation rod, which corresponds to a streak of intensity in reciprocal space normal to the surface. When two or more non-parallel facets are present, both the crystal orientation and the crystal facets can be identified. This enables facets to be rapidly indexed and uncommon facets, and planar defects, that have been difficult to study before to be identified. We demonstrate the technique with (i) epitaxial core-shell InGaN/GaN multiple quantum-wells grown on GaN nanowires, where surface facets and planar defects are determined, and (ii) single randomly oriented highly faceted tetrahedrahexal Pt nanoparticles. The methodology is applicable to a broad range of nanocrystals and provides a unique insight into the connection between structure and properties of nanomaterials.

AB - The physical and chemical properties of nanostructures depend on their surface facets. Here, we exploit a pole figure approach to determine the three-dimensional orientation matrix of a nanostructure from a single Bragg reflection measured with a coherent nano-focused X-ray beam. The signature of any truncated (faceted) crystal produces a crystal truncation rod, which corresponds to a streak of intensity in reciprocal space normal to the surface. When two or more non-parallel facets are present, both the crystal orientation and the crystal facets can be identified. This enables facets to be rapidly indexed and uncommon facets, and planar defects, that have been difficult to study before to be identified. We demonstrate the technique with (i) epitaxial core-shell InGaN/GaN multiple quantum-wells grown on GaN nanowires, where surface facets and planar defects are determined, and (ii) single randomly oriented highly faceted tetrahedrahexal Pt nanoparticles. The methodology is applicable to a broad range of nanocrystals and provides a unique insight into the connection between structure and properties of nanomaterials.

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