Crystal plasticity parameter identification by integrated DIC on microscopic topographies

J.P.M. Hoefnagels, M. Bertin, C. Du, F. Hild

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Abstract

The present study unravels details of the micromechanical behavior of a micro-specimen made of IF-steel. A triangular prism is machined via focused ion beam (FIB) and contains two ferritic grains. Four experimental tools are integrated to identify the material’s crystal parameters: (i) an optical confocal microscope captures height profile images, (ii) an in-situ tensile stage prescribes the loading history to the macro-specimen, (iii) a global Digital Image Correlation (DIC) algorithm measures the 3D surface displacement fields, and iv) an extension of Integrated-DIC for 3D displacement fields is implemented to assess the micromechanical behavior. It is demonstrated that with this methodology the identification of the boundary conditions and crystal plasticity parameters is successfully achieved.

Original languageEnglish
Title of host publicationResidual Stress, Thermomechanics and Infrared Imaging, Hybrid Techniques and Inverse Problems
Subtitle of host publicationProceedings of the 2017 Annual Conference on Experimental and Applied Mechanics
EditorsA. Baldi, J.M. Considine, S. Quinn, X. Balandraud
Place of PublicationBerlin
PublisherSpringer
Chapter8
Pages47-49
Number of pages3
Volume8
ISBN (Electronic)978-3-319-62899-8
ISBN (Print)9783319628981
DOIs
Publication statusPublished - 2018
Event2017 Annual Conference and Exposition on Experimental and Applied Mechanics - Indianapolis, United States
Duration: 12 Jun 201715 Jun 2017

Publication series

NameConference Proceedings of the Society for Experimental Mechanics Series
ISSN (Print)2191-5644
ISSN (Electronic)2191-5652

Conference

Conference2017 Annual Conference and Exposition on Experimental and Applied Mechanics
CountryUnited States
CityIndianapolis
Period12/06/1715/06/17

Keywords

  • Crystal plasticity
  • Digital height correlation
  • Digital image correlation
  • In-Situ testing
  • Integrated digital image correlation
  • Parameter identification

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